Baseline Flatness ±0.001 A, 200–800 nm, 1.0 nm
Description Evolution One UV-Vis Spectrophotometer
Detector Type Dual Silicon Photodiodes
Dimensions (L x W x H) 593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)
Light Source Xenon Flash
Product Line Evolution One
Spectral Bandwidth 1.0 nm
Type UV-Vis Spectrophotometer
Wavelength Range 190 to 1100 nm
Drift <0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hour warmup Electrical Requirements 100/240 V, 50/60 Hz selected automatically, 150 W maximum Lamp Life >5 years or longer if not using live signal Noise 0A: ≤0.00015 A
1A: ≤0.00025 A
2A: ≤0.00050 A
260 nm, 1.0 nm SBW, RMS< Optical Design Double-beam with sample and reference cuvette positions Czerny-Turner Monochromator Pharmacopoeia Compliance Testing Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line Photometric Accuracy 1 A: ±0.004 A, 2 A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST Photometric Display -0.3 to 4.0 A Photometric Range >3.5 A
Photometric Repeatability 1 A: ±0.0002 A
Scan Ordinate Modes Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity
Scan Speed <1 to 6000 nm/min. (Variable)
Warranty 3-year Source Replacement Warranty
Wattage 150 W max.
Wavelength Accuracy ±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)
Wavelength Data Interval 10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm
Wavelength Repeatability ≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)