Key Features

• Combine field emission SEM (FE-SEM) technology with analytics.
• Profit from proven Gemini electron optics.
• Choose from a variety of detector options: image particles, surfaces, and nanostructures in materials science, investigate semiconductor or medical devices, geological or biological samples.
• Save time with the semi-automated 4-step workflow of Sigma: structure imaging and analysis routines and increase productivity.
• FE-SEM users of all disciplines in research and industry labs now benefit from a resolution of 1.3 nm at 1 kV in ZEISS Sigma 500 and better usability all around.
• Tailor Sigma to your needs using the latest detection technology and characterize all of your samples.
• Characterize composition, crystallography and surface topography with the annular backscatter detector (aBSD).
• It delivers excellent low kV images under all vacuum conditions. Benefit from improved sensitivity, increased signal-to-noise ratio, and more speed.
• Enjoy a new generation of secondary electron (SE) detectors. Benefit from the C2D and VPSE detectors of Sigma in variable pressure mode: working at low vacuum, you can expect crisp images with up to 85% more contrast.