SIGMA FE-SEM

Model : CarlZeiss

Country of Origin: USA

ZEISS SIGMA FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy. ZEISS Sigma 300 delivers excellence in price and performance. Achieve your elemental analysis fast and convenient with the best-in-class EDS geometry of ZEISS Sigma 500.

Key Features

Combine field emission SEM (FE-SEM) technology with analytics.
Profit from proven Gemini electron optics.
Choose from a variety of detector options: image particles, surfaces, and nanostructures in materials science, investigate semiconductor or medical devices, geological or biological samples.
Save time with the semi-automated 4-step workflow of Sigma: structure imaging and analysis routines and increase productivity.
FE-SEM users of all disciplines in research and industry labs now benefit from a resolution of 1.3 nm at 1 kV in ZEISS Sigma 500 and better usability all around.
Tailor Sigma to your needs using the latest detection technology and characterize all of your samples.
Characterize composition, crystallography and surface topography with the annular backscatter detector (aBSD).
It delivers excellent low kV images under all vacuum conditions. Benefit from improved sensitivity, increased signal-to-noise ratio, and more speed.
Enjoy a new generation of secondary electron (SE) detectors. Benefit from the C2D and VPSE detectors of Sigma in variable pressure mode: working at low vacuum, you can expect crisp images with up to 85% more contrast.