NEX DE VS – AIPL Industrial

NEX DE VS

Model : NEX DE VS

Country of Origin: JAPAN

A high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix – from solids, thin films and alloys to powders, liquids, slurries and thin films.

Key Features

Analyze ₁₁Na to ₉₂U non-destructively
1, 3 and 10 mm spot sizes, software selectable
High resolution imaging for accurate sample positioning
Powerful QuantEZ Windows®-based software
Solids, liquids, alloys, powders and thin films
60 kV X-ray tube for wide elemental coverage
FAST SDD® detector for superior counting statistics
Multiple automated tube filters for enhanced sensitivity
Unmatched performance-to-price ratio
Optional RPF-SQX fundamental parameters software
Optional standardless fundamental parameters software