ZEISS Crossbeam

Model : CarlZeiss

Country of Origin: USA

FIB-SEM for High Throughput 3D Analysis and Sample Preparation. Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). ZEISS Crossbeam’s modular platform concept and upgrade the system with growing needs.

Key Features

ZEISS Crossbeam’s modular platform concept and upgrade the system with growing needs, e.g. with the LaserFIB for massive material ablation.
During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.
Take advantage of up to 30% better SEM resolution at low voltage using Tandem decel, a feature of the novel ZEISS Gemini electron optics.
Extract true sample information from your high resolution SEM images using Gemini electron optics.
Count on the SEM performance of your ZEISS Crossbeam for 2D surface sensitive images or when performing 3D tomography.
Benefit from high resolution, contrast and signal-to-noise ratios, even when using very low acceleration voltages.
Characterize your sample comprehensively with a range of detectors. Get pure materials contrast with the unique Inlens EsB detector.
Investigate non-conductive specimens undisturbed by charging artifacts.